Charles W. Cha, William E. Donath, Füsun Özgüner. 9-V Algorithm for Test Pattern Generation of Combinational Digital Circuits. IEEE Transactions on Computers, 27(3):193-200, 1978.
@article{ChaDO78,
title = {9-V Algorithm for Test Pattern Generation of Combinational Digital Circuits},
author = {Charles W. Cha and William E. Donath and Füsun Özgüner},
year = {1978},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/ChaDO78},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {27},
number = {3},
pages = {193-200},
}