Detection of Microplastics Using Machine Learning

Zenon Chaczko, Peter Wajs-Chaczko, David Tien, Yousef Haidar. Detection of Microplastics Using Machine Learning. In 2019 International Conference on Machine Learning and Cybernetics, ICMLC 2019, Kobe, Japan, July 7-10, 2019. pages 1-8, IEEE, 2019. [doi]

Authors

Zenon Chaczko

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Peter Wajs-Chaczko

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David Tien

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Yousef Haidar

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