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TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS

Hochang Chae, Xiulin Jin, Seonghun Lee, Jeonghun Cho. TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS. In Dominik Slezak, Tai-Hoon Kim, Kiumi Akingbehin, Tao Jiang 0001, June M. Verner, Silvia Abrahão, editors, Advances in Software Engineering - International Conference on Advanced Software Engineering and Its Applications, ASEA 2009 Held as Part of the Future Generation Information Technology Conference, FGIT 2009, Jeju Island, Korea, December 10-12, 2009. Proceedings. Volume 59 of Communications in Computer and Information Science, pages 204-212, Springer, 2009. [doi]

Authors

Hochang Chae

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Xiulin Jin

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Seonghun Lee

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Jeonghun Cho

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