Situation aware RFID system: evaluating abnormal behavior detecting approach

Heeseo Chae, Taek Lee, Hoh Peter In. Situation aware RFID system: evaluating abnormal behavior detecting approach. In The Fourth IEEE Workshop on Software Technologies for Future Embedded and Ubiquitous Systems and the Second International Workshop on Collaborative Computing, Integration, and Assurance, SEUS 2006 / WCCIA 2006, Gyeongju, South Korea, April 27-28, 2006. pages 115-120, IEEE Computer Society, 2006. [doi]

Authors

Heeseo Chae

This author has not been identified. Look up 'Heeseo Chae' in Google

Taek Lee

This author has not been identified. Look up 'Taek Lee' in Google

Hoh Peter In

This author has not been identified. Look up 'Hoh Peter In' in Google