A Software Defect Management System Based on Knowledge Base

Haiyan Chai, Nan Zhang, Bojiang Liu, Longli Tang. A Software Defect Management System Based on Knowledge Base. In 2018 IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2018, Lisbon, Portugal, July 16-20, 2018. pages 652-653, IEEE, 2018. [doi]

Authors

Haiyan Chai

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Nan Zhang

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Bojiang Liu

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Longli Tang

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