Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis. A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-2, IEEE, 2014. [doi]
@inproceedings{ChaixZN14,
title = {A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis},
author = {Fabien Chaix and Nacer-Eddine Zergainoh and Michael Nicolaidis},
year = {2014},
doi = {10.1109/ETS.2014.6847827},
url = {http://dx.doi.org/10.1109/ETS.2014.6847827},
researchr = {https://researchr.org/publication/ChaixZN14},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014},
editor = {Giorgio Di Natale},
publisher = {IEEE},
}