Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation - researchr publication authors

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S. Chakravarthi, A. T. Krishnan, V. Reddy, S. Krishnan. Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation. Microelectronics Reliability, 47(6):863-872, 2007. [doi]

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