Sreejit Chakravarty, Vinodh Gopal. Techniques to Encode and Compress Fault Dictionaries. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 195-200, IEEE Computer Society, 1999. [doi]
@inproceedings{ChakravartyG99,
title = {Techniques to Encode and Compress Fault Dictionaries},
author = {Sreejit Chakravarty and Vinodh Gopal},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/vts/1999/0146/00/01460195abs.htm},
researchr = {https://researchr.org/publication/ChakravartyG99},
cites = {0},
citedby = {0},
pages = {195-200},
booktitle = {17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0146-X},
}