Víctor H. Champac, Joan Figueras. Current Testing of CMOS Combinational Circuits with Single Floating Gate Defects. VLSI Design, 5(3):273-284, 1997. [doi]
@article{ChampacF97,
title = {Current Testing of CMOS Combinational Circuits with Single Floating Gate Defects},
author = {Víctor H. Champac and Joan Figueras},
year = {1997},
doi = {10.1155/1997/97381},
url = {https://doi.org/10.1155/1997/97381},
researchr = {https://researchr.org/publication/ChampacF97},
cites = {0},
citedby = {0},
journal = {VLSI Design},
volume = {5},
number = {3},
pages = {273-284},
}