Stochastic threshold group testing

Chun Lam Chan, Sheng Cai, Mayank Bakshi, Sidharth Jaggi, Venkatesh Saligrama. Stochastic threshold group testing. In 2013 IEEE Information Theory Workshop, ITW 2013, Sevilla, Spain, September 9-13, 2013. pages 1-5, IEEE, 2013. [doi]

Authors

Chun Lam Chan

This author has not been identified. Look up 'Chun Lam Chan' in Google

Sheng Cai

This author has not been identified. Look up 'Sheng Cai' in Google

Mayank Bakshi

This author has not been identified. Look up 'Mayank Bakshi' in Google

Sidharth Jaggi

This author has not been identified. Look up 'Sidharth Jaggi' in Google

Venkatesh Saligrama

This author has not been identified. Look up 'Venkatesh Saligrama' in Google