Modeling Multiple Time Series for Anomaly Detection

Philip K. Chan, Matthew V. Mahoney. Modeling Multiple Time Series for Anomaly Detection. In Proceedings of the 5th IEEE International Conference on Data Mining (ICDM 2005), 27-30 November 2005, Houston, Texas, USA. pages 90-97, IEEE Computer Society, 2005. [doi]

Authors

Philip K. Chan

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Matthew V. Mahoney

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