Active learning using localized generalization error of candidate sample as criterion

Patrick P. K. Chan, Wing W. Y. Ng, Daniel S. Yeung. Active learning using localized generalization error of candidate sample as criterion. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Waikoloa, Hawaii, USA, October 10-12, 2005. pages 3604-3609, IEEE, 2005. [doi]

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