Mansun Chan, Xuemei Xi, Jin He, Kanyu M. Cao, Mohan V. Dunga, Ali M. Niknejad, Ping K. Ko, Chenming Hu. Practical compact modeling approaches and options for sub-0.1 mum CMOS technologies. Microelectronics Reliability, 43(3):399-404, 2003. [doi]
@article{ChanXHCDNKH03,
title = {Practical compact modeling approaches and options for sub-0.1 mum CMOS technologies},
author = {Mansun Chan and Xuemei Xi and Jin He and Kanyu M. Cao and Mohan V. Dunga and Ali M. Niknejad and Ping K. Ko and Chenming Hu},
year = {2003},
doi = {10.1016/S0026-2714(02)00278-0},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00278-0},
tags = {modeling, systematic-approach},
researchr = {https://researchr.org/publication/ChanXHCDNKH03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {3},
pages = {399-404},
}