Sujeet Chand. Decentralized monitoring and diagnosis of manufacturing processes. In International Symposium on Autonomous Decentralized Systems, ISADS 1993, Kawasaki, Japan, March 30 - April 1, 1993. pages 384-389, IEEE Computer Society, 1993. [doi]
@inproceedings{Chand93-0,
title = {Decentralized monitoring and diagnosis of manufacturing processes},
author = {Sujeet Chand},
year = {1993},
doi = {10.1109/ISADS.1993.262679},
url = {http://dx.doi.org/10.1109/ISADS.1993.262679},
researchr = {https://researchr.org/publication/Chand93-0},
cites = {0},
citedby = {0},
pages = {384-389},
booktitle = {International Symposium on Autonomous Decentralized Systems, ISADS 1993, Kawasaki, Japan, March 30 - April 1, 1993},
publisher = {IEEE Computer Society},
isbn = {0-8186-3125-2},
}