Modular eigenfabrics based classifier for the detection of defects in woven fabric

Jayanta K. Chandra, Pradipta K. Banerjee, Asit K. Datta. Modular eigenfabrics based classifier for the detection of defects in woven fabric. In Mita Nasipuri, Sarmistha Neogy, Jamuna Kanta Sing, Amit Konar, Ujjwal Maulik, Subhadip Basu, Debasish Jana, editors, International Conference on Recent Trends in Information Systems, ReTIS 2011, December 21-23, 2011, Jadavpur University, Kolkata, India, Proceedings. pages 223-228, IEEE Computer Society , 2011.

@inproceedings{ChandraBD11,
  title = {Modular eigenfabrics based classifier for the detection of defects in woven fabric},
  author = {Jayanta K. Chandra and Pradipta K. Banerjee and Asit K. Datta},
  year = {2011},
  researchr = {https://researchr.org/publication/ChandraBD11},
  cites = {0},
  citedby = {0},
  pages = {223-228},
  booktitle = {International Conference on Recent Trends in Information Systems, ReTIS 2011, December 21-23, 2011, Jadavpur University, Kolkata, India, Proceedings},
  editor = {Mita Nasipuri and Sarmistha Neogy and Jamuna Kanta Sing and Amit Konar and Ujjwal Maulik and Subhadip Basu and Debasish Jana},
  publisher = {IEEE Computer Society },
  isbn = {978-1-4577-0792-6},
}