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The influence of packaging materials on RF performance

Arun Chandrasekhar, Steven Brebels, Serguei Stoukatch, Eric Beyne, Walter De Raedt, Bart Nauwelaers. The influence of packaging materials on RF performance. Microelectronics Reliability, 43(3):351-357, 2003. [doi]

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Arun Chandrasekhar

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Steven Brebels

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Serguei Stoukatch

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Eric Beyne

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Walter De Raedt

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Bart Nauwelaers

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