Edward Chang. Kernel-size selection for defect pixel identification and correction. In Russel A. Martin, Jeffrey M. DiCarlo, Nitin Sampat, editors, Digital Photography III, San Jose, CA, USA, January 29-30, 2007. Volume 6502 of SPIE Proceedings, SPIE, 2007. [doi]
@inproceedings{Chang07-17,
title = {Kernel-size selection for defect pixel identification and correction},
author = {Edward Chang},
year = {2007},
doi = {10.1117/12.705383},
url = {http://dx.doi.org/10.1117/12.705383},
researchr = {https://researchr.org/publication/Chang07-17},
cites = {0},
citedby = {0},
booktitle = {Digital Photography III, San Jose, CA, USA, January 29-30, 2007},
editor = {Russel A. Martin and Jeffrey M. DiCarlo and Nitin Sampat},
volume = {6502},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-6615-0},
}