Extraction of VBIC model parameters for InGaAsSb DHBTs

Yang-Hua Chang, Jian-Wen Chen. Extraction of VBIC model parameters for InGaAsSb DHBTs. Microelectronics Reliability, 50(3):370-375, 2010. [doi]

@article{ChangC10-4,
  title = {Extraction of VBIC model parameters for InGaAsSb DHBTs},
  author = {Yang-Hua Chang and Jian-Wen Chen},
  year = {2010},
  doi = {10.1016/j.microrel.2009.12.005},
  url = {http://dx.doi.org/10.1016/j.microrel.2009.12.005},
  researchr = {https://researchr.org/publication/ChangC10-4},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {50},
  number = {3},
  pages = {370-375},
}