Jun-Ru Chang, Chin-Yu Huang. A Study of Enhanced MC/DC Coverage Criterion for Software Testing. In 31st Annual International Computer Software and Applications Conference (COMPSAC 2007), 24-27 July 2007, Beijing, China. pages 457-464, IEEE Computer Society, 2007. [doi]
@inproceedings{ChangH07:0,
title = {A Study of Enhanced MC/DC Coverage Criterion for Software Testing},
author = {Jun-Ru Chang and Chin-Yu Huang},
year = {2007},
doi = {10.1109/COMPSAC.2007.44},
url = {http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2007.44},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/ChangH07%3A0},
cites = {0},
citedby = {0},
pages = {457-464},
booktitle = {31st Annual International Computer Software and Applications Conference (COMPSAC 2007), 24-27 July 2007, Beijing, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-2870-0},
}