Yang-Hua Chang, Yao-Jen Liu. A self-consistent extraction procedure for source/drain resistance in MOSFETs. Microelectronics Reliability, 51(12):2049-2052, 2011. [doi]
@article{ChangL11-11,
title = {A self-consistent extraction procedure for source/drain resistance in MOSFETs},
author = {Yang-Hua Chang and Yao-Jen Liu},
year = {2011},
doi = {10.1016/j.microrel.2011.04.023},
url = {http://dx.doi.org/10.1016/j.microrel.2011.04.023},
researchr = {https://researchr.org/publication/ChangL11-11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {12},
pages = {2049-2052},
}