Structure-Based Specification-Constrained Test Frequency Generation for Linear Analog Circuits

Soon-Jyh Chang, Chung-Len Lee, Jwu E. Chen. Structure-Based Specification-Constrained Test Frequency Generation for Linear Analog Circuits. J. Inf. Sci. Eng., 19(4):637-651, 2003. [doi]

Authors

Soon-Jyh Chang

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Chung-Len Lee

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Jwu E. Chen

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