Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection - researchr publication authors

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Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng. Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. In IEEE International Conference on Automation Science and Engineering, CASE 2005, Edmonton, Alberta, Canada, August 1-2, 2005. pages 301-306, IEEE, 2005. [doi]

This author has not been identified. Look up 'Chuan-Yu Chang' in GoogleThis author has not been identified. Look up 'Si-Yan Lin' in GoogleThis author has not been identified. Look up 'MuDer Jeng' in Google

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