Sam Chao, Yiping Li. Uncovering Potential Attribute Relevance via MIA-Processing in Data Mining. In Workshops Proceedings of the 6th IEEE International Conference on Data Mining (ICDM 2006), 18-22 December 2006, Hong Kong, China. pages 218-222, IEEE Computer Society, 2006. [doi]
@inproceedings{ChaoL06:0,
title = {Uncovering Potential Attribute Relevance via MIA-Processing in Data Mining},
author = {Sam Chao and Yiping Li},
year = {2006},
doi = {10.1109/ICDMW.2006.162},
url = {http://doi.ieeecomputersociety.org/10.1109/ICDMW.2006.162},
tags = {data-flow},
researchr = {https://researchr.org/publication/ChaoL06%3A0},
cites = {0},
citedby = {0},
pages = {218-222},
booktitle = {Workshops Proceedings of the 6th IEEE International Conference on Data Mining (ICDM 2006), 18-22 December 2006, Hong Kong, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-2702-7},
}