Hanen Chaouch, Khaled Ouni, Lotfi Nabli. Industrial process defect classification by exploiting PCA and fuzzy logic. In International Conference on Control, Automation and Diagnosis, ICCAD 2017, Hammamet, Tunisia, January 19-21, 2017. pages 379-384, IEEE, 2017. [doi]
@inproceedings{ChaouchON17,
title = {Industrial process defect classification by exploiting PCA and fuzzy logic},
author = {Hanen Chaouch and Khaled Ouni and Lotfi Nabli},
year = {2017},
doi = {10.1109/CADIAG.2017.8075688},
url = {https://doi.org/10.1109/CADIAG.2017.8075688},
researchr = {https://researchr.org/publication/ChaouchON17},
cites = {0},
citedby = {0},
pages = {379-384},
booktitle = {International Conference on Control, Automation and Diagnosis, ICCAD 2017, Hammamet, Tunisia, January 19-21, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5987-4},
}