S. Jonathan Chapman, Philippe H. Trinh, Thomas P. Witelski. Exponential Asymptotics for Thin Film Rupture. SIAM Journal of Applied Mathematics, 73(1):232-253, 2013. [doi]
@article{ChapmanTW13, title = {Exponential Asymptotics for Thin Film Rupture}, author = {S. Jonathan Chapman and Philippe H. Trinh and Thomas P. Witelski}, year = {2013}, doi = {10.1137/120872012}, url = {http://dx.doi.org/10.1137/120872012}, researchr = {https://researchr.org/publication/ChapmanTW13}, cites = {0}, citedby = {0}, journal = {SIAM Journal of Applied Mathematics}, volume = {73}, number = {1}, pages = {232-253}, }