S. Jonathan Chapman, Philippe H. Trinh, Thomas P. Witelski. Exponential Asymptotics for Thin Film Rupture. SIAM Journal of Applied Mathematics, 73(1):232-253, 2013. [doi]
@article{ChapmanTW13,
title = {Exponential Asymptotics for Thin Film Rupture},
author = {S. Jonathan Chapman and Philippe H. Trinh and Thomas P. Witelski},
year = {2013},
doi = {10.1137/120872012},
url = {http://dx.doi.org/10.1137/120872012},
researchr = {https://researchr.org/publication/ChapmanTW13},
cites = {0},
citedby = {0},
journal = {SIAM Journal of Applied Mathematics},
volume = {73},
number = {1},
pages = {232-253},
}