IGBT advanced model used on degraded mode analysis

Faiza Charfi, Bruno Francois, Mohamed Ben Messaoud, Kamal Al-Haddad, Fayçal Sellami. IGBT advanced model used on degraded mode analysis. In IEEE International Conference on Systems, Man and Cybernetics, Yasmine Hammamet, Tunisia, October 6-9, 2002 - Volume 2. pages 6, IEEE, 2002. [doi]

@inproceedings{CharfiFMAS02,
  title = {IGBT advanced model used on degraded mode analysis},
  author = {Faiza Charfi and Bruno Francois and Mohamed Ben Messaoud and Kamal Al-Haddad and Fayçal Sellami},
  year = {2002},
  doi = {10.1109/ICSMC.2002.1175743},
  url = {https://doi.org/10.1109/ICSMC.2002.1175743},
  researchr = {https://researchr.org/publication/CharfiFMAS02},
  cites = {0},
  citedby = {0},
  pages = {6},
  booktitle = {IEEE International Conference on Systems, Man and Cybernetics, Yasmine Hammamet, Tunisia, October 6-9, 2002 - Volume 2},
  publisher = {IEEE},
  isbn = {0-7803-7437-1},
}