On Symmetric Losses for Learning from Corrupted Labels - researchr publication authors

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Nontawat Charoenphakdee, Jongyeong Lee, Masashi Sugiyama. On Symmetric Losses for Learning from Corrupted Labels. In Kamalika Chaudhuri, Ruslan Salakhutdinov, editors, Proceedings of the 36th International Conference on Machine Learning, ICML 2019, 9-15 June 2019, Long Beach, California, USA. Volume 97 of Proceedings of Machine Learning Research, pages 961-970, PMLR, 2019. [doi]

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