Effectiveness and scaling trends of leakage control techniques for sub-130nm CMOS technologies - researchr publication authors

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Bhaskar Chatterjee, Manoj Sachdev, Steven Hsu, Ram Krishnamurthy, Shekhar Borkar. Effectiveness and scaling trends of leakage control techniques for sub-130nm CMOS technologies. In Ingrid Verbauwhede, Hyung Roh, editors, Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003, Seoul, Korea, August 25-27, 2003. pages 122-127, ACM, 2003. [doi]

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