Liang Che, Xuan Liu 0003, Zuyi Li. Fast Screening of High-Risk Lines Under False Data Injection Attacks. IEEE Trans. Smart Grid, 10(4):4003-4014, 2019. [doi]
@article{CheLL19b,
title = {Fast Screening of High-Risk Lines Under False Data Injection Attacks},
author = {Liang Che and Xuan Liu 0003 and Zuyi Li},
year = {2019},
doi = {10.1109/TSG.2018.2848256},
url = {https://doi.org/10.1109/TSG.2018.2848256},
researchr = {https://researchr.org/publication/CheLL19b},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Smart Grid},
volume = {10},
number = {4},
pages = {4003-4014},
}