Function Insight: Highlighting Suspicious Sections in Binary Run Traces

Michelle Cheatham, Jason Raber. Function Insight: Highlighting Suspicious Sections in Binary Run Traces. In Martin Pinzger, Denys Poshyvanyk, Jim Buckley, editors, 18th Working Conference on Reverse Engineering, WCRE 2011, Limerick, Ireland, October 17-20, 2011. pages 433-434, IEEE Computer Society, 2011. [doi]

@inproceedings{CheathamR11,
  title = {Function Insight: Highlighting Suspicious Sections in Binary Run Traces},
  author = {Michelle Cheatham and Jason Raber},
  year = {2011},
  doi = {10.1109/WCRE.2011.63},
  url = {http://doi.ieeecomputersociety.org/10.1109/WCRE.2011.63},
  researchr = {https://researchr.org/publication/CheathamR11},
  cites = {0},
  citedby = {0},
  pages = {433-434},
  booktitle = {18th Working Conference on Reverse Engineering, WCRE 2011, Limerick, Ireland, October 17-20, 2011},
  editor = {Martin Pinzger and Denys Poshyvanyk and Jim Buckley},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4577-1948-6},
}