An intelligent hybrid system for wafer lot output time prediction

Toly Chen. An intelligent hybrid system for wafer lot output time prediction. AI in Engineering, 21(1):55-65, 2007. [doi]

@article{Chen07:10,
  title = {An intelligent hybrid system for wafer lot output time prediction},
  author = {Toly Chen},
  year = {2007},
  doi = {10.1016/j.aei.2006.10.002},
  url = {http://dx.doi.org/10.1016/j.aei.2006.10.002},
  researchr = {https://researchr.org/publication/Chen07%3A10},
  cites = {0},
  citedby = {0},
  journal = {AI in Engineering},
  volume = {21},
  number = {1},
  pages = {55-65},
}