An intelligent mechanism for lot output time prediction and achievability evaluation in a wafer fab

Toly Chen. An intelligent mechanism for lot output time prediction and achievability evaluation in a wafer fab. Computers & Industrial Engineering, 54(1):77-94, 2008. [doi]

@article{Chen08a-10,
  title = {An intelligent mechanism for lot output time prediction and achievability evaluation in a wafer fab},
  author = {Toly Chen},
  year = {2008},
  doi = {10.1016/j.cie.2007.06.036},
  url = {http://dx.doi.org/10.1016/j.cie.2007.06.036},
  researchr = {https://researchr.org/publication/Chen08a-10},
  cites = {0},
  citedby = {0},
  journal = {Computers & Industrial Engineering},
  volume = {54},
  number = {1},
  pages = {77-94},
}