Enhancing the efficiency and accuracy of cell-aware testing to reach zero defects

Harry H. Chen. Enhancing the efficiency and accuracy of cell-aware testing to reach zero defects. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1, IEEE, 2017. [doi]

Authors

Harry H. Chen

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