Exhaustive Test Pattern Generation Using Cyclic Codes - researchr publication bibtex

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C. L. Chen. Exhaustive Test Pattern Generation Using Cyclic Codes. IEEE Transactions on Computers, 37(2):225-228, 1988.

@article{Chen88:2,
  title = {Exhaustive Test Pattern Generation Using Cyclic Codes},
  author = {C. L. Chen},
  year = {1988},
  tags = {testing, C++, code generation},
  researchr = {https://researchr.org/publication/Chen88%3A2},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Computers},
  volume = {37},
  number = {2},
  pages = {225-228},
}

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