A Comparison of Regression, Neural Net, and Pattern Recognition Approaches to IR

Aitao Chen. A Comparison of Regression, Neural Net, and Pattern Recognition Approaches to IR. In Georges Gardarin, James C. French, Niki Pissinou, Kia Makki, Luc Bouganim, editors, Proceedings of the 1998 ACM CIKM International Conference on Information and Knowledge Management, Bethesda, Maryland, USA, November 3-7, 1998. pages 140-147, ACM, 1998. [doi]

Authors

Aitao Chen

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