Yue Chen, Yalong Bai, Wei Zhang, Tao Mei. Destruction and Construction Learning for Fine-Grained Image Recognition. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 5157-5166, Computer Vision Foundation / IEEE, 2019. [doi]
@inproceedings{ChenBZM19,
title = {Destruction and Construction Learning for Fine-Grained Image Recognition},
author = {Yue Chen and Yalong Bai and Wei Zhang and Tao Mei},
year = {2019},
url = {http://openaccess.thecvf.com/content_CVPR_2019/html/Chen_Destruction_and_Construction_Learning_for_Fine-Grained_Image_Recognition_CVPR_2019_paper.html},
researchr = {https://researchr.org/publication/ChenBZM19},
cites = {0},
citedby = {0},
pages = {5157-5166},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019},
publisher = {Computer Vision Foundation / IEEE},
}