Analysis on Product Technical Risk With Bayesian Belief Networks - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ming Chen, Yun Chen, Bingsen Chen, Qun Wang. Analysis on Product Technical Risk With Bayesian Belief Networks. In Kesheng Wang, George L. Kovács, Michael J. Wozny, Minglun Fang, editors, Knowledge Enterprise: Intelligent Strategies in Product Design, Manufacturing, and Management, Proceedings of PROLAMAT 2006, IFIP TC5 International Conference, June 15-17, 2006, Shanghai, China. Volume 207 of IFIP, pages 990-995, Springer, 2006. [doi]

This author has not been identified. Look up 'Ming Chen' in GoogleThis author has not been identified. Look up 'Yun Chen' in GoogleThis author has not been identified. Look up 'Bingsen Chen' in GoogleThis author has not been identified. Look up 'Qun Wang' in Google

runs on WebDSL