Error Analysis of NIST SP 800-22 Test Suite

Dongyu Chen, Hua Chen, Limin Fan, Kai Luo. Error Analysis of NIST SP 800-22 Test Suite. IEEE Transactions on Information Forensics and Security, 18:3745-3759, 2023. [doi]

Authors

Dongyu Chen

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Hua Chen

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Limin Fan

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Kai Luo

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