Test generation for crosstalk-induced faults: framework and computational result

Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer. Test generation for crosstalk-induced faults: framework and computational result. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 305-310, IEEE Computer Society, 2000. [doi]

@inproceedings{ChenGB00a,
  title = {Test generation for crosstalk-induced faults: framework and computational result},
  author = {Wei-Yu Chen and Sandeep K. Gupta and Melvin A. Breuer},
  year = {2000},
  url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870305abs.htm},
  tags = {testing},
  researchr = {https://researchr.org/publication/ChenGB00a},
  cites = {0},
  citedby = {0},
  pages = {305-310},
  booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0887-1},
}