The following publications are possibly variants of this publication:
- Defect Isolation from Whole to Local Field Separation in Complex Interferometry Fringe Patterns through Development of Weighted Least-Squares AlgorithmZhenkai Chen, Wenjing Zhou, Yingjie Yu, Vivi Tornari, Gilberto Artioli. digital, 4(1):104-113, March 2024. [doi]
- Parallel thinning Algorithm for Binary Digital PatternsYung-Sheng Chen, Wen-Hsing Hsu. In Chi-hau Chen, L.-F. Pau, Patrick S. P. Wang, editors, Handbook of Pattern Recognition and Computer Vision. pages 457-490, World Scientific, 1993. [doi]