WAL-assisted Tiering: Painlessly Improving Your Favorite Log-Structured KV Store Instead of Building a New One - researchr publication authors

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Xubin Chen, Jingpeng Hao, Yifan Qiao, Tong Zhang. WAL-assisted Tiering: Painlessly Improving Your Favorite Log-Structured KV Store Instead of Building a New One. In MEMSYS 2020: The International Symposium on Memory Systems, Washington, DC, USA, September, 2020. pages 304-316, ACM, 2020. [doi]

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