A unified model for detecting efficient and inefficient outliers in data envelopment analysis

Wen-Chih Chen, Andrew L. Johnson. A unified model for detecting efficient and inefficient outliers in data envelopment analysis. Computers & OR, 37(2):417-425, 2010. [doi]

Authors

Wen-Chih Chen

This author has not been identified. Look up 'Wen-Chih Chen' in Google

Andrew L. Johnson

This author has not been identified. Look up 'Andrew L. Johnson' in Google