Hongtian Chen, Bin Jiang 0001, Steven X. Ding, Ningyun Lu, Wen Chen 0007. Probability-Relevant Incipient Fault Detection and Diagnosis Methodology With Applications to Electric Drive Systems. IEEE Trans. Contr. Sys. Techn., 27(6):2766-2773, 2019. [doi]
@article{ChenJDLC19,
title = {Probability-Relevant Incipient Fault Detection and Diagnosis Methodology With Applications to Electric Drive Systems},
author = {Hongtian Chen and Bin Jiang 0001 and Steven X. Ding and Ningyun Lu and Wen Chen 0007},
year = {2019},
doi = {10.1109/TCST.2018.2866976},
url = {https://doi.org/10.1109/TCST.2018.2866976},
researchr = {https://researchr.org/publication/ChenJDLC19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Contr. Sys. Techn.},
volume = {27},
number = {6},
pages = {2766-2773},
}