Jung-Sheng Chen, Ming-Dou Ker. Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process. IEICE Transactions, 91-C(3):378-384, 2008. [doi]
@article{ChenK08a,
title = {Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process},
author = {Jung-Sheng Chen and Ming-Dou Ker},
year = {2008},
doi = {10.1093/ietele/e91-c.3.378},
url = {http://dx.doi.org/10.1093/ietele/e91-c.3.378},
researchr = {https://researchr.org/publication/ChenK08a},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-C},
number = {3},
pages = {378-384},
}