Huifen Chen, Wei-Lun Kuo. Comparisons of the symmetric and asymmetric control limits for X and R charts. Computers & Industrial Engineering, 59(4):903-910, 2010. [doi]
@article{ChenK10-11,
title = {Comparisons of the symmetric and asymmetric control limits for X and R charts},
author = {Huifen Chen and Wei-Lun Kuo},
year = {2010},
doi = {10.1016/j.cie.2010.08.021},
url = {http://dx.doi.org/10.1016/j.cie.2010.08.021},
researchr = {https://researchr.org/publication/ChenK10-11},
cites = {0},
citedby = {0},
journal = {Computers & Industrial Engineering},
volume = {59},
number = {4},
pages = {903-910},
}