Wei-Zen Chen, Po-I. Kuo. A ΔΣ TDC with sub-ps resolution for PLL built-in phase noise measurement. In nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016. pages 347-350, IEEE, 2016. [doi]
@inproceedings{ChenK16-10,
title = {A ΔΣ TDC with sub-ps resolution for PLL built-in phase noise measurement},
author = {Wei-Zen Chen and Po-I. Kuo},
year = {2016},
doi = {10.1109/ESSCIRC.2016.7598313},
url = {http://dx.doi.org/10.1109/ESSCIRC.2016.7598313},
researchr = {https://researchr.org/publication/ChenK16-10},
cites = {0},
citedby = {0},
pages = {347-350},
booktitle = {nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2972-3},
}