Characterization of RFID Strap Using Single-Ended Probe

Sung-Lin Chen, Ken-Huang Lin. Characterization of RFID Strap Using Single-Ended Probe. IEEE T. Instrumentation and Measurement, 58(10):3619-3626, 2009. [doi]

@article{ChenL09-52,
  title = {Characterization of RFID Strap Using Single-Ended Probe},
  author = {Sung-Lin Chen and Ken-Huang Lin},
  year = {2009},
  doi = {10.1109/TIM.2009.2018697},
  url = {http://dx.doi.org/10.1109/TIM.2009.2018697},
  researchr = {https://researchr.org/publication/ChenL09-52},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {58},
  number = {10},
  pages = {3619-3626},
}