Yung-Sheng Chen, Tsay-Der Lin. Simulation of closure process for line patterns. In 13th International Conference on Pattern Recognition, ICPR 1996, Vienna, Austria, 25-19 August, 1996. pages 215-219, IEEE, 1996. [doi]
@inproceedings{ChenL96-1,
title = {Simulation of closure process for line patterns},
author = {Yung-Sheng Chen and Tsay-Der Lin},
year = {1996},
doi = {10.1109/ICPR.1996.546820},
url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1996.546820},
researchr = {https://researchr.org/publication/ChenL96-1},
cites = {0},
citedby = {0},
pages = {215-219},
booktitle = {13th International Conference on Pattern Recognition, ICPR 1996, Vienna, Austria, 25-19 August, 1996},
publisher = {IEEE},
}