Jianhang Chen, Qian Lin, Jan P. Allebach. Deep Learning for Printed Mottle Defect Grading. In Jan P. Allebach, Zhigang Fan, Qian Lin, editors, Imaging and Multimedia Analytics in a Web and Mobile World 2020, Burlingame, CA, USA, January 26-30, 2020. pages 1-9, Society for Imaging Science and Technology, 2020. [doi]
@inproceedings{ChenLA20, title = {Deep Learning for Printed Mottle Defect Grading}, author = {Jianhang Chen and Qian Lin and Jan P. Allebach}, year = {2020}, doi = {10.2352/ISSN.2470-1173.2020.8.IMAWM-184}, url = {https://doi.org/10.2352/ISSN.2470-1173.2020.8.IMAWM-184}, researchr = {https://researchr.org/publication/ChenLA20}, cites = {0}, citedby = {0}, pages = {1-9}, booktitle = {Imaging and Multimedia Analytics in a Web and Mobile World 2020, Burlingame, CA, USA, January 26-30, 2020}, editor = {Jan P. Allebach and Zhigang Fan and Qian Lin}, publisher = {Society for Imaging Science and Technology}, }