Hongtian Chen, Hao Luo 0003, Biao Huang 0001, Bin Jiang 0001, Okyay Kaynak. Transfer Learning-Motivated Intelligent Fault Diagnosis Designs: A Survey, Insights, and Perspectives. IEEE Transactions on Neural Networks, 35(3):2969-2983, March 2024. [doi]
@article{ChenLHJK24,
title = {Transfer Learning-Motivated Intelligent Fault Diagnosis Designs: A Survey, Insights, and Perspectives},
author = {Hongtian Chen and Hao Luo 0003 and Biao Huang 0001 and Bin Jiang 0001 and Okyay Kaynak},
year = {2024},
month = {March},
doi = {10.1109/TNNLS.2023.3290974},
url = {https://doi.org/10.1109/TNNLS.2023.3290974},
researchr = {https://researchr.org/publication/ChenLHJK24},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Neural Networks},
volume = {35},
number = {3},
pages = {2969-2983},
}